Next Scanning and Analytical TEM doctoral school
The scanning and analytical TEM doctoral school MSE-635 is held once per year in the spring semester. The next running of the course will be in the Spring 2019 semester from 30 April–2 May.
30 April–2 May
Wednesday: 08h15-12h00 in DIA 004; 13h15-17h00 demos in CIME (MXC-010 / 012 / 030)
Thursday: 08h15-12h00 in DIA 005
To register for the course please contact your doctoral school program.
Exam date: TBA
Exam format: oral
1) To know the standard methods available for chemical analysis in a TEM.
2) To understand the image contrast formation in scanning transmission electron microscopy (BF, DF, HAADF).
3) To understand physical processes behind X-Ray analysis in a TEM.
4) To understand the physical processes behind Electron Energy Loss spectrometry in a TEM.
5) To assess applicability of each of the technique presented, depending on the problem to be solved.
6) To be able to understand a paper using one of those technique .
This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.
Demonstrations will be given on the microscopes.
Required prior knowledge: Doctoral school MSE-637 Transmission Electron Microscopy and Diffraction or equivalent.
Program and lecture notes
Please download lecture notes before the lectures.
No printed material will be distributed
- MSE-635 STEM and AEM 2019 Program
- Chapter 1 STEM.pdf
- STEM_EDX 2019
- TEM Tomography 2019
- Chapter 4 Cs-TEM vs Cs-STEM.pdf
- Chapter 5 EELS-DS2019
- Chapter 6 HRTEM Sim 2018.pdf