MSE-635 Scanning and Analytical Transmission Electron Microscopy

Next Scanning and Analytical TEM doctoral school

The scanning and analytical TEM doctoral school MSE-635 is held once per year in the spring semester. The next running of the course will be in the Spring 2019 semester from 30 April–2 May.

Spring 2019

30 April–2 May

1 credit

Tuesday: 10h15-12h00 in DIA 004, 13h15-17h00 in GCD 0386

Wednesday: 08h15-12h00 in DIA 004; 13h15-17h00 demos in CIME (MXC-010 / 012 / 030)

Thursday: 08h15-12h00 in DIA 005

To register for the course please contact your doctoral school program.

Exam date: TBA

Exam format: oral


1) To know the standard methods available for chemical analysis in a TEM.
2) To understand the image contrast formation in scanning transmission electron microscopy (BF, DF, HAADF).
3) To understand physical processes behind X-Ray analysis in a TEM.
4) To understand the physical processes behind Electron Energy Loss spectrometry in a TEM.
5) To assess applicability of each of the technique presented, depending on the problem to be solved.
6) To be able to understand a paper using one of those technique .


This intensive course is intended for researchers who are potential new users of transmission electron microscopes and have followed the introductory doctoral course on TEM or have already a good background in conventional transmission electron microscopy. It will provide them with a basic understanding of the methods, relying on an explanation of the physics at play.

Demonstrations will be given on the microscopes.

Required prior knowledge: Doctoral school MSE-637 Transmission Electron Microscopy and Diffraction or equivalent.

Program and lecture notes

Please download lecture notes before the lectures.

No printed material will be distributed