MSE-636b Scanning Electron Microscopy Techniques

Next SEM doctoral school

The SEM doctoral school MSE-636 is held two times per year, once in the autumn semester (MSE-636a) and once in the spring semester (MSE-636b).

The next running of the course will be MSE-636b in the Autumn 2018 semester from 29–31 October.

To register for the course please contact your doctoral program.

Spring 2019

1-3 April, rooms DIA003 and CO011

1 credit

Monday : 10h15-12h00 room:DIA003; 13h15-17h00 room: CO011

Tuesday : 08h15-11h00 room:DIA003; 13h15-17h00 demos in CIME

Wednesday : 08h15-12h00 room:DIA003

To register for the course MSE-636a through your doctoral school program.

EXAM:

29 april, room INM 200

Exam format: written. Lecture notes allowed (on Laptop: no internet connection!), no written report required !

Objectives:

1) To understand the basics of a scanning electron microscope and its capabilities.
2) To understand the image contrast formation in scanning electron microscopy (SE, BSE, low-kV, resolution).
3) To understand analytical techniques as X-Ray spectroscopy and Electron backscatter diffraction.
4) To understand image formation in environmental SEM.
5) To understand Ion beam techniques (FIB and He-Ion microscopy).
6) To assess the different possibilities and application domains (Materials sciences, biology, crystalline or amorphous materials…).

Content:

This intensive course is intended for researchers who are potential new users of scanning electron microscopes. It will provide them with a basic understanding of the instruments, optics of SEM, the imaging modes, the associated analytical techniques EDS, related theories of image formation.

Demonstrations will be given on the microscopes.