MSE-637b Transmission Electron Microscopy and Diffraction

Next TEM doctoral school

The TEM doctoral school MSE-637 is held two times per year, once in the autumn semester (MSE-637a) and once in the spring semester (MSE-637b).

The next running of the course will be MSE-637b in the Spring 2019 semester from: 8–10 April 2019.

To register for the course please contact your doctoral program.

Spring 2019

8-10 April

1 credit

Monday: 10h15-12h00 in DIA 003; 13h15-17h00 in CO 011

Tuesday: 08h15-12h00 in DIA 003; 13h15-17h00 demos in CIME

Wednesday: 08h15-12h00 in DIA 003 

Please register for the course MSE-637b through your Doctoral Program.

Exam date: TBA

Exam place: TBA

Exam format: written


1) To understand the basics of the transmission electron microscope and its imaging capabilities.
2) To understand electron diffraction.
3) To understand TEM image contrast, in particular for bright-field and dark-field imaging modes.
4) To understand the basics of image contrast in high-resolution TEM.
5) To assess TEM specimen preparation techniques for different materials (i.e. non-biological) samples.
6) To understand various application examples relevant to materials science, physics and chemistry.


This intensive course is intended for researchers who are potential new users of transmission electron microscopes for study of materials (i.e. all non-biological) samples. It will provide them with a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and related theories of image formation.

Demonstrations will be given on the microscopes.

Basic knowledge of crystallography and diffraction is advised.