MSE-637b Transmission Electron Microscopy and Diffraction

Next TEM doctoral school

The TEM doctoral school MSE-637 is held two times per year, once in the autumn semester (MSE-637a) and once in the spring semester (MSE-637b).

The next running of the course will be MSE-637b in the Spring 2019 semester from: 8–10 April 2019.

To register for the course please contact your doctoral program.

Spring 2019

8-10 April

1 credit

Monday: 10h15-12h00 in DIA 003; 13h15-17h00 in CO 011

Tuesday: 08h15-12h00 in DIA 003; 13h15-17h00 demos in CIME

Wednesday: 08h15-12h00 in DIA 003 

Please register for the course MSE-637b through your Doctoral Program.

Exam date: TBA

Exam place: TBA

Exam format: written

Objectives:

1) To understand the basics of the transmission electron microscope and its imaging capabilities.
2) To understand electron diffraction.
3) To understand TEM image contrast, in particular for bright-field and dark-field imaging modes.
4) To understand the basics of image contrast in high-resolution TEM.
5) To assess TEM specimen preparation techniques for different materials (i.e. non-biological) samples.
6) To understand various application examples relevant to materials science, physics and chemistry.

Content:

This intensive course is intended for researchers who are potential new users of transmission electron microscopes for study of materials (i.e. all non-biological) samples. It will provide them with a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and related theories of image formation.

Demonstrations will be given on the microscopes.

Basic knowledge of crystallography and diffraction is advised.