The 3D Electron Microscopy and FIB-Nanotomography doctoral school MSE-704 is held once per year in the spring semester. The next running of the course will be form 6-8 Mai.
Dates: 6-8 Mai
DIA003 and CO011
To register for the course please contact your Doctoral Program secretary.
Exam date: report
Understand the principles of 3D surface (SEM) and volume (SEM/FIB and TEM) reconstruction by electron microscopy. Know the possibilities and limitations of the different techniques for materials science applications.
Electron microscopes deliver only 2D information in a single image. The 3rd dimension is often left to the interpretation by the observer. Different techniques have been developed to use 2 or more images to reconstruct the 3rd dimension. To investigate and analyze the complex structures produced by micro- and nano-technology 3D electron microscopy is offering power-ful methods. The resolution of modern electron microscopes and the possibility to choose be-tween different signals make them versatile tools for the exploration of the micro- and nano-cosmos.
- Physics of the different signals generated by electron beams and focused ion beams.
- Underlying physical principles for the acquisition of data sets for 3D reconstruction: interaction volumes, voxel (3 dimensional “pixel”) size, mechanical stability issues for successful recon-struction.
- Surface reconstruction (SEM), serial (parallel) sectioning (SEM/FIB and TEM), tilt series tomo-graphy (TEM).
- Introduction to the use of software packages for 3D surface and volume reconstruction.
- Practical session about 3D volume reconstruction by FIB nano-tomography.
Required prior knowledge:
- Background in electron microscopy: electron microscopy lecture 5 sem.
- Bachelor level or doctoral school SEM&TEM or equivalent.
Downloads and links
- Program, Slides
- MSE-704 program 2019
- 1_Intro and surface
- 2_ Introduction to Tomo and SerSec
- 3_4 FIB
- 3D EDX